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| Content Provider | The American Society of Mechanical Engineers (ASME) Digital Collection |
|---|---|
| Author | Xiang, Bin Yang, Lei Huang, Jian Fu, Qi |
| Copyright Year | 2015 |
| Abstract | Recently two-dimensional layered semiconductors with promising electronic and optical properties, have opened up a new way for applications in atomically thin electronics and optoelectronics. Here we demonstrate large area synthesis of monolayer MoS2 and WSe2 using a chemical vapor deposition method at ambient pressure. The atomic analysis of the as-grown monolayer was conducted by spherical-aberration-corrected high resolution scanning transmission electron microscopy and atomic force microscopy. Raman spectroscopy was utilized to identify the monolayer configuration of the as-grown samples. Strong photoluminescence peaks at a visible wavelength were observed at room temperature in the as-grown monolayer samples. The mobility and carrier concentrations were calculated in as-grown monolayer-based transistor devices. The emergency of these two dimensional materials provides grand possibilities for future semiconductor device applications. |
| Sponsorship | Electronic and Photonic Packaging Division |
| File Format | |
| ISBN | 9780791856901 |
| DOI | 10.1115/IPACK2015-48286 |
| Volume Number | Volume 3: Advanced Fabrication and Manufacturing; Emerging Technology Frontiers; Energy, Health and Water- Applications of Nano-, Micro- and Mini-Scale Devices; MEMS and NEMS; Technology Update Talks; Thermal Management Using Micro Channels, Jets, Sprays |
| Conference Proceedings | ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels |
| Language | English |
| Publisher Date | 2015-07-06 |
| Publisher Place | San Francisco, California, USA |
| Access Restriction | Subscribed |
| Subject Keyword | Semiconductors (materials) Atomic force microscopy Mechanical admittance Temperature Semiconductor devices Photoluminescence Electronics Emergencies Optoelectronic devices Raman spectroscopy Chemical vapor deposition Pressure Transmission electron microscopy Visible spectrum Resolution (optics) Transistors |
| Content Type | Text |
| Resource Type | Article |
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