NDLI: Subpage programming for extending the lifetime of NAND flash memory

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Workload uncertainty characterization and adaptive frequency scaling for energy minimization of embedded systems

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Subpage programming for extending the lifetime of NAND flash memory

Content Provider	ACM Digital Library
Author	Kim, Jung-Hoon Kim, Sang-Hoon Kim, Jin-Soo
Abstract	During the past decade, the density of NAND flash memory has been increased in many folds. The increase has been driven by storing multiple bits in a cell and scaling down the fabrication process. Such advance in manufacturing technology, however, has been significantly impaired the reliability of flash memory so that it becomes one of the major concerns in use of flash memory. Moreover, as flash memory writes data in the unit of flash page, the trend of the increase in page size worsens the reliability by amplifying a small update to a full flash page programming. In this paper, we propose a new programming method to improve the flash endurance cycle, especially when a small amount of data are written repeatedly. The proposed method, so called "subpage programming", partitions a page into smaller subpages. A small amount of data can be programmed to one of the subpages while the other subpages are inhibited from the programming by leveraging the mechanisms of flash cell programming. Thus, the number of flash cells that undergo programming is minimized. We evaluated the effect of the proposed subpage programming on real NAND flash memory chips from three different manufacturers. Our evaluation results show that subpage programming improves the flash endurance cycle by up to 258%.
Starting Page	555
Ending Page	560
Page Count	6
File Format	PDF
ISBN	9783981537048
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2015-03-09
Publisher Place	San Jose
Access Restriction	Subscribed
Content Type	Text
Resource Type	Article

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