NDLI: Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scattering.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	Jonah, Emmanuel O. Härting, Margit Gullikson, Eric Aquila, Andrew Britton, David T.
Description	Country affiliation: South Africa Author Affiliation: Jonah EO ( NanoSciences Innovation Centre, Department of Physics, University of Cape Town, Rondebosch 7701, South Africa.); Härting M ( NanoSciences Innovation Centre, Department of Physics, University of Cape Town, Rondebosch 7701, South Africa.); Gullikson E ( Center for X-ray Optics, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, USA.); Aquila A ( European XFEL GmbH, Notkestrasse 85, Hamburg 22607, Germany.); Britton DT ( NanoSciences Innovation Centre, Department of Physics, University of Cape Town, Rondebosch 7701, South Africa.)
Abstract	A new small-angle scattering technique in reflection geometry is described which enables a topological study of rough surfaces. This is achieved by using long-wavelength soft X-rays which are scattered at wide angles but in the low-Q range normally associated with small-angle scattering. The use of nanometre-wavelength radiation restricts the penetration to a thin surface layer which follows the topology of the surface, while moving the scattered beam to wider angles preventing shadowing by the surface features. The technique is, however, only applicable to rough surfaces for which there is no specular reflection, so that only the scattered beam was detected by the detector. As an example, a study of the surfaces of rough layers of silicon produced by the deposition of nanoparticles by blade-coating is presented. The surfaces of the blade-coated layers have rough features of the order of several micrometers. Using 2 nm and 13 nm X-rays scattered at angular ranges of 5° ≤ Î¸ ≤ 51° and 5° ≤ Î¸ ≤ 45°, respectively, a combined range of scattering vector of 0.00842 Å(-1) ≤ Q ≤ 0.4883 Å(-1) was obtained. Comparison with previous transmission SAXS and USAXS studies of the same materials indicates that the new method does probe the surface topology rather than the internal microstructure.
File Format	HTM / HTML
ISSN	09090495
Issue Number	Pt 3
Journal	Journal of Synchrotron Radiation
Volume Number	21
e-ISSN	16005775
Language	English
Publisher	IUCr
Publisher Date	2014-05-01
Publisher Place	United States
Access Restriction	Subscribed
Subject Keyword	Discipline Radiology
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Instrumentation Radiation

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