NDLI: Tight focusing properties of phase modulated transversely polarized sinh Gaussian beam

Content Provider	Springer Nature Link
Author	Sundaram, C. Mohana Prabakaran, K. Anbarasan, P. M. Rajesh, K. B. Musthafa, A. Mohamed Aroulmoji, V.
Copyright Year	2016
Abstract	We studied the tight focusing properties of an azimuthally polarized sinh-Gaussian beam phase modulated with multi belt vortex phase filter on the basis of the vector diffraction theory. The sinh-Gaussian beam can be considered as superposition of a series of eccentric Gaussian beams and it is observed that focusing such a beam with a properly designed dedicated vortex phase filter generates many novel focal patterns including transversely polarized optical needle of extended focal depth with sub wavelength scale lateral resolution and mutiple focal spots with different axial seperation distance. We expect that such a focal patterns are usefull in applications such as semiconductor inspection and multiple optical trapping.
Starting Page	1
Ending Page	10
Page Count	10
File Format	PDF
ISSN	03068919
Journal	Optical and Quantum Electronics
Volume Number	49
Issue Number	1
e-ISSN	1572817X
Language	English
Publisher	Springer US
Publisher Date	2016-12-19
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Vector diffraction theory High NA lens Transversely polarized sinh beam Optics, Lasers, Photonics, Optical Devices Electrical Engineering Characterization and Evaluation of Materials Computer Communication Networks
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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