NDLI: Texture Transfer Mechanism of Buffer Layer in Coated Conductors

Content Provider	Springer Nature Link
Author	Wang, Y. Zhou, L. Li, C. S. Yu, Z. M. Li, J. S. Jin, L. H. Wang, P. F. Lu, Y. F.
Copyright Year	2011
Abstract	We have studied the texture transfer process of buffer layers prepared by chemical solution deposition (CSD) methods on YSZ (00l) single crystal substrates and biaxial textured Ni–W substrates. The structure, texture, and surface morphology of the buffer layers were investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), and scanning electron microscopy (SEM). Our results show that the degree of texture and the surface morphology of the buffer layers vary with the changes of the substrate and the lattice mismatch of the top buffer layers with La$_{2}$Zr$_{2}$O$_{7}$ (LZO) after crystallization in argon–hydrogen atmosphere. Moreover, the growth mode of multi-layer films and the type of the lattice strain have strong influence on the formation and the transfer of the bi-axial texture in multi-layer buffer architecture. It suggests that there exists a possible connection between the strain relaxation and the texture transfer in buffer layer fabricated by CSD methods. Information on the texture transfer of buffer layer is important for optimizing the buffer layer architecture in coated conductors.
Starting Page	811
Ending Page	816
Page Count	6
File Format	PDF
ISSN	15571939
Journal	Journal of Superconductivity and Novel Magnetism
Volume Number	25
Issue Number	4
e-ISSN	15571947
Language	English
Publisher	Springer US
Publisher Date	2011-11-12
Publisher Place	Boston
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Coated conductors Buffer layer Chemical solution deposition method Characterization and Evaluation of Materials Magnetism, Magnetic Materials Strongly Correlated Systems, Superconductivity Condensed Matter Physics
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Condensed Matter Physics

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