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A multi-port thermal coupling model for multi-chip power modules suitable for circuit simulators
Content Provider | Scilit |
---|---|
Author | Wang, Z. X. Wang, H. Zhang, Y. Blaabjerg, F. |
Copyright Year | 2018 |
Description | Journal: Microelectronics Reliability |
Related Links | https://vbn.aau.dk/ws/files/310751246/ESREF20180531_2.0.pdf |
Ending Page | 523 |
Page Count | 5 |
Starting Page | 519 |
ISSN | 00262714 |
DOI | 10.1016/j.microrel.2018.06.031 |
Journal | Microelectronics Reliability |
Volume Number | 88-90 |
Language | English |
Publisher | Elsevier BV |
Publisher Date | 2018-09-30 |
Access Restriction | Open |
Subject Keyword | Journal: Microelectronics Reliability Multi-chip Power Module |
Content Type | Text |
Resource Type | Article |
Subject | Nanoscience and Nanotechnology Surfaces, Coatings and Films Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials Condensed Matter Physics Safety, Risk, Reliability and Quality Electrical and Electronic Engineering |