NDLI: Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component

Content Provider	Scilit
Author	Tang, Hongyu Ye, Huaiyu Wong, Cell K. Y. Leung, Stanely Y. Y. Fan, Jiajie Chen, Xianping Fan, Xuejun Zhang, Guoqi
Copyright Year	2017
Description	Journal: Microelectronics Reliability
Related Links	https://repository.tudelft.nl/islandora/object/uuid:1fd964eb-af3f-4635-a8d9-5b48cd523767/datastream/OBJ/download
Ending Page	204
Page Count	8
Starting Page	197
ISSN	00262714
DOI	10.1016/j.microrel.2017.09.008
Journal	Microelectronics Reliability
Volume Number	78
Language	English
Publisher	Elsevier BV
Publisher Date	2017-11-01
Access Restriction	Open
Subject Keyword	Journal: Microelectronics Reliability Industrial Relations
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Surfaces, Coatings and Films Atomic and Molecular Physics, and Optics Electronic, Optical and Magnetic Materials Condensed Matter Physics Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component