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Efficient Elastic Imaging of Single Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy
| Content Provider | Scilit |
|---|---|
| Author | Hovden, R. Muller, D. |
| Copyright Year | 2011 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/EBFDE97B031510FC16397BBFA257CFFD/S1431927611007148a.pdf/div-class-title-efficient-elastic-imaging-of-single-atoms-with-aberration-corrected-scanning-transmission-electron-microscopy-div.pdf |
| Ending Page | 1255 |
| Page Count | 2 |
| Starting Page | 1254 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927611007148 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 17 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2011-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Scanning Transmission Electron Microscopy |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |