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Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
| Content Provider | Scilit |
|---|---|
| Author | Balogh, Mp Dutta, I. |
| Copyright Year | 2010 |
| Related Links | http://pdfs.semanticscholar.org/fcb1/8af66574318a92f29f0a7344052d9d6d61d5.pdf https://www.cambridge.org/core/services/aop-cambridge-core/content/view/F45CA09804E3CC99CC3FBA0E830DC69D/S1431927610054310a.pdf/div-class-title-secondary-electron-imaging-with-an-aberration-corrected-scanning-transmission-electron-microscope-div.pdf |
| Ending Page | 139 |
| Page Count | 2 |
| Starting Page | 138 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927610054310 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 16 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2010-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Secondary Electron Scanning Transmission Corrected Scanning |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |