Loading...
Please wait, while we are loading the content...
Similar Documents
Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes
| Content Provider | Scilit |
|---|---|
| Author | Kohno, Y. Shibata, N. Sawada, H. Findlay, Sd Kondo, Y. Ikuhara, Y. |
| Copyright Year | 2010 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E480C11E22C78E66393A6555465CF995/S1431927610057120a.pdf/div-class-title-development-of-a-segmented-detector-for-aberration-corrected-scanning-transmission-electron-microscopes-div.pdf |
| Ending Page | 761 |
| Page Count | 2 |
| Starting Page | 760 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927610057120 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 16 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2010-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Segmented Detector Scanning Transmission Corrected Scanning |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |