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| Content Provider | IET Digital Library |
|---|---|
| Author | Saremi, Mehdi |
| Abstract | One of the significant advantages of the ultraviolet (UV) light exposure of chalcogenide glasses (ChGs), photodoping process, is in the application of programmable metallisation cells (PMCs) as a novel non-volatile resistive memory. The memory state of a PMC is dictated by the formation or dissolution of a metallic filament in a ChG film between active metal and inert metal contacts. Owing to relatively rigid covalent bonds mixed with soft van der Waals interconnections, ChGs are able to form acceptor-like traps where electrons are absorbed, and therefore electron mobility decreases compared with crystallised structures. The role of electrons in the interaction with ionic species in ChGs is inevitable. One the other hand, holes are considered as majority carries and their role in interaction with the system is also significant. Therefore, knowing carrier mobility in ChGs is essential. To extract carrier mobilities, for the first time a circuit setup accompanying with time constant extraction method for Ge30Se70 as a ChG material without and with UV light exposure is proposed. Owing to being straightforward, this method can be applied to other ChG materials as well as other light sources or even ionising radiation particles. |
| Starting Page | 762 |
| Ending Page | 764 |
| Page Count | 3 |
| Volume Number | 11 |
| e-ISSN | 17500443 |
| Issue Number | Issue 11, Nov (2016) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/mnl/11/11 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/mnl.2016.0132 |
| Journal | Micro & Nano Letters |
| Publisher Date | 2016-11-01 |
| Access Restriction | Open |
| Rights Holder | © The Institution of Engineering and Technology |
| Subject Keyword | Acceptor-like Traps Active Metal Amorphous And Glassy Semiconductors Bonds (chemical) Carrier Mobility Extraction Chalcogenide Glass Film Chalcogenide Glasses Charge Carriers Covalent Bonds Crystallised Structures Dissolving Doping And Implantation of Impurities Electrical Property of Amorphous And Glassy Semiconductors (thin Films/low-dimensional Structures) Electrical Property of Metal-semiconductor-metal Structures Electron Mobility Electron Traps Ge30Se70 Generation Germanium Compound Hole Mobility Hole Traps Inert Metal Contacts Insulator Integrated Circuit Interconnections Ionising Radiation Particle Lifetime And Trapping Low-field Transport And Mobility Memory Circuit Metal-insulator-metal And Metal-semiconductor-metal Structure Metal-semiconductor-metal Structure Metallic Filament Dissolution Metallisation And Interconnection Technology Mixing Nonvolatile Resistive Memory Photodoping Piezoresistance Programmable Metallisation Cell Radiation Effect (semiconductor Technology) Recombination Resistive RAM Segregation Semiconductor Semiconductor Device Metallisation Semiconductor Doping Semiconductor Thin Film SemiConductor/Insulator Soft Van Der Waals Interconnections Solubility Time Constant Extraction Method Ultraviolet Light Exposure Ultraviolet Radiation Effect Ultraviolet, Visible And Infrared Radiation Effect Van Der Waals Forces |
| Content Type | Text |
| Resource Type | Article |
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