NDLI: High-performance, low-cost, and highly reliable radiation hardened latch design

Content Provider	IET Digital Library
Author	Yan, Aibin Liang, Huaguo Huang, Zhengfeng Jiang, Cuiyun
Abstract	Technology scaling results in that, soft errors, due to radiation-induced single event double-upset (SEDU) that affects double nodes through charge sharing, become a prominent concern in nanoscale CMOS technology. Existing hardened schemes suffer from being not fully SEDU-immune, or perform with too large cost penalties regarding propagation delay, silicon area, and power dissipation. A novel high-performance, low-cost, and fully SEDU-immune latch, referred to as HSMUF, is presented to tolerate SEDU when any arbitrary combination pair of nodes is affected by a particle striking. The latch mainly consists of a clock gating-based triple path DICE and a multiple-input Muller C-element. Simulation results demonstrate the SEDU-immunity and a 99.73% area–power–delay product saving for the HSMUF latch, compared with the SEDU fully immune DNCS-SEUT latch.
Starting Page	139
Ending Page	141
Page Count	3
ISSN	00135194
Volume Number	52
e-ISSN	1350911X
Issue Number	Issue 2, Jan (2016)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/el/52/2
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/el.2015.3020
Journal	Electronics Letters
Publisher Date	2015-12-01
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Charge Sharing Clock Gating-based Triple Path DICE Digital Circuit Design, Modelling And Testing Double Nodes Flip Flops HSMUF Latch Logic And Switching Circuit Logic Circuit Logic Design Method Multiple-input Muller C-element Nanoscale CMOS Technology Particle Striking Power Dissipation Propagation Delay Radiation Effect (semiconductor Technology) Radiation Hardening (electronics) Radiation-induced Single Event Double-upset SEDU-immune Latch SEDU-immunity Silicon Area Soft Error Technology Scaling Result
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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