NDLI: Odd-weight-column SEC–DED

Content Provider	IET Digital Library
Author	Liu, Shan Shan Reviriego, Pedro Macián, Alfonso Sánchez Xiao, Liyi Maestro, Juan Antonio
Abstract	Single-error correction, double-error detection (SEC–DED) codes are a type of error-correction codes widely used in electronics to protect memory devices from data corruption. Odd-weight-column SEC–DED codes are a type of these codes where the parity-check matrix is built with every column including an odd number of ones. With this approach, double errors have an even-weight syndrome and can be differentiated from single errors and, consequently, easily detected. There are applications, such as avionics or space, where a multiple error usually affects adjacent cells. Adapting SEC–DED codes to protect against triple-adjacent errors is interesting in these applications. A modification to existing odd-weight-column SEC–DED codes to add triple-adjacent error detection (TAED), creating SEC–DED–TAED codes, is presented. The implementation of the additional triple-adjacent detection logic for these codes can be performed with limited performance and area overhead.
Starting Page	119
Ending Page	120
Page Count	2
ISSN	00135194
Volume Number	52
e-ISSN	1350911X
Issue Number	Issue 2, Jan (2016)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/el/52/2
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/el.2015.3535
Journal	Electronics Letters
Publisher Date	2015-12-09
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Avionics Application Code Error Correction Code Error Detection Code Even-weight Syndrome Integrated Memory Circuit Memory Circuit Memory Device Protection Odd-weight-column SEC–DED–TAED Code Parity Check Code Parity-Check Matrix Semiconductor Storage Single-error Correction Double-error Detection Code Space Application Triple-adjacent Detection Logic Triple-adjacent Error Detection
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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