NDLI: Linear energy control of laser drilling and its application for TFT-LCD bright pixel repairing

Content Provider	IEEE Xplore Digital Library
Author	Chen, T. Ming-Tzer Lin
Copyright Year	2011
Description	Author affiliation: Graduate Institute of Precision Engineering, National Chung Hsing University, Taichung 402, Taiwan, R.O.C. (Chen, T.; Ming-Tzer Lin)
Abstract	Laser drilling is energy dependent and linear proportion to the thickness of the materials. Therefore, a linear laser power supplier will be convenient applying in extensive aperture processes. However, practically, the energy output of laser equipments is non-linear. To obtain a linear energy output, laser power meter is utilized for energy compensation, but the application of laser power meter requires ceasing the operation of laser equipment. In this paper, a linear energy compensation method was investigated and designed by using a measurement of laser energy output that provides a stable linear energy laser for processes. In the method, the laser energy testing only requires a fixed time for measuring laser energy and changing laser energy compensate table. Furthermore, the laser equipment doses not need stop during the laser power meter calibration. In addition, a software method for linear energy compensation was designed and applied to the laser equipments which have no laser power meter compensation practices. The method could control and compensate laser energy in linear output which the energy linear proportion (R square) reaches 0.9989 and provided a very stable power source. When using this laser method in the LCD panel design processes, the successes rate reached 80% in performing the bright pixel repair. In panel defect repair, it could prevent taking the case apart from module and fabricate that increases the efficiency in production.
Starting Page	330
Ending Page	333
File Size	1510275
Page Count	4
File Format	PDF
ISBN	9781612849058
e-ISBN	9782355000157
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-05-11
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	CMP
Subject Keyword	Laser theory Cooling Indium tin oxide non-linear energy Materials Logic gates bright pixel repair linear energy compensation Thin film transistors
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Rheology printing of oxide transistors

Back channel etch oxide TFT on plastic substrate for the application of high resolution TFT-LCD

Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps

Transparent oxide semiconductors: Recent material developments and new applications

Effects of Nd in Nd_xIn_1-xO₃ Semiconductors for Thin-Film Transistors

Charge Recycling Method on Pixel Level

Effect of Aluminum and Gallium Doping on the Performance of Solution-Processed Indium Oxide Thin-Film Transistors

Solution-Processed Low-Operating-Voltage Thin-Film Transistors With Bottom-Gate Top-Contact Structure

Dual Gate Indium–Zinc Oxide Thin-Film Transistors Based on Anodic Aluminum Oxide Gate Dielectrics

Linear energy control of laser drilling and its application for TFT-LCD bright pixel repairing

Similar Documents

Rheology printing of oxide transistors

Back channel etch oxide TFT on plastic substrate for the application of high resolution TFT-LCD

Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps

Transparent oxide semiconductors: Recent material developments and new applications

Effects of Nd in NdxIn1-xO3 Semiconductors for Thin-Film Transistors

Charge Recycling Method on Pixel Level

Effect of Aluminum and Gallium Doping on the Performance of Solution-Processed Indium Oxide Thin-Film Transistors

Solution-Processed Low-Operating-Voltage Thin-Film Transistors With Bottom-Gate Top-Contact Structure

Dual Gate Indium–Zinc Oxide Thin-Film Transistors Based on Anodic Aluminum Oxide Gate Dielectrics

Linear energy control of laser drilling and its application for TFT-LCD bright pixel repairing

Effects of Nd in Nd_xIn_1-xO₃ Semiconductors for Thin-Film Transistors