NDLI: The effect of parallel projection towards image performance

Content Provider	IEEE Xplore Digital Library
Author	Muji, S.Z.M. Abdul Rahim, R. Leow Pei Ling Fazalul Rahiman, M.H. Abd Shaib, M.F. Nor Ayob, N.M. Mohamad, E.J. Zakaria, Z. Puspanathan, M.J. Mansor, M.S.B. Mohd Fadzil, N.S.
Copyright Year	2011
Description	Author affiliation: Process Tomography & Instrumentation Research Group, Cybernetics Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Skudai, Johor, Malaysia (Abdul Rahim, R.; Leow Pei Ling; Nor Ayob, N.M.; Puspanathan, M.J.; Mansor, M.S.B.; Mohd Fadzil, N.S.) \|\| Tomography Imaging Research Group, School of Mechatronic Engineering, Universiti Malaysia, Perlis, Ulu Pauh Campus, 02600 Arau, Malaysia (Fazalul Rahiman, M.H.; Zakaria, Z.) \|\| Faculty of Electrical and Electronic Engineering, Universiti Tun Hussein Onn Malaysia, 86400 Parit Raja, Batu Pahat, Johor, Malaysia (Muji, S.Z.M.; Abd Shaib, M.F.; Mohamad, E.J.)
Abstract	In tomography, there are two common projection namely, parallel beam and fan beam. Both projections give a different impact towards system performance and the image itself. This paper will focus on the attenuation factor that affects towards images in parallel projection. The focuses are to see the differences between one, two, three and four projections towards image performance. The projection is come from light that is produced by LED infrared while photodiode is act as receiver. Any appearance of object between transmitter and receiver will change the voltage that is produce by receiver. The bigger the object, the more voltage losses will be sensed. The voltage loss will be manipulated to form an image where it is found out that the more the projection is applied, the image will be displayed clearer and have more information on it.
Starting Page	229
Ending Page	234
File Size	816213
Page Count	6
File Format	PDF
ISBN	9781467300995
e-ISBN	9781467301022
DOI	10.1109/SCOReD.2011.6148741
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-12-19
Publisher Place	Malaysia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	image Sensitivity Image color analysis Parallel beam Receivers Tomography Attenuation optical tomography Optical transmitters tomogram
Content Type	Text
Resource Type	Article

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