NDLI: High precision 3D measurement using area modulated phase-shifting binary patterns

Content Provider	IEEE Xplore Digital Library
Author	Haiqing Huang Xiangzhong Fang Xiangyang Li Qingchun Lu Hang Ren
Copyright Year	2013
Description	Author affiliation: Key Lab. of Airborne Opt. Imaging & Meas., Changchun Inst. of Opt., Fine Mech. & Phys., Changchun, China (Hang Ren) \|\| Sch. of Electron., Shanghai Jiao Tong Univ., Shanghai, China (Haiqing Huang; Xiangzhong Fang; Xiangyang Li; Qingchun Lu)
Abstract	This paper presents a novel area-modulated phase-shifting binary method for three-dimensional (3D) shape measurement. First, the defocused triangular binary pattern is introduced to obtain the high-quality sinusoidal fringe without gamma correction. Then, the modified three steps phase-shifting algorithm which includes an average intensity image is adopted to get the wrapped phase and the object mask. After that, a multi-frequency method is used to obtain the unwrapped phase. Finally, a two-step matching method is applied to get the corresponding matching points. The experiments show that the proposed method is more precise and efficient compared with the previous methods.
Sponsorship	IEEE Circuits Syst. Soc.
Starting Page	1344
Ending Page	1348
File Size	1089927
Page Count	5
File Format	PDF
ISBN	9781467347143
ISSN	21579563
DOI	10.1109/ICNC.2013.6818188
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-07-23
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Gaussian smoothing Three-dimensional displays Phase measurement Accuracy Shape measurement Optimized production technology area modulation Image reconstruction 3D shape measurement triangular binary pattern phase unwrapping
Content Type	Text
Resource Type	Article

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