NDLI: A robust method to estimate Power and Delay for Digital Integrated Circuits

Content Provider	IEEE Xplore Digital Library
Author	Aghababa, H. Forouzandeh, B. Dehghan, H. Afzali-Kusha, A.
Copyright Year	2009
Description	Author affiliation: School of Electrical and Computer Engineering, University of Tehran, Iran (Aghababa, H.; Forouzandeh, B.; Dehghan, H.; Afzali-Kusha, A.)
Abstract	Advancements in nano-scale Integrated Circuits manufacturing technology has resulted in variability of performance metrics. The performance parameters such as Power and Delay are no longer represented deterministically. As a result, circuit designers and manufacturers need to make use of statistical analysis to estimate performance of Integrated Circuits. In this paper we present a new methodology to increase the accuracy of estimation compared to prior methods. We introduce Bayesian analysis as a powerful mathematical and statistical approach to incorporate the prior observations in calculating the Probability Density Function (PDF) of performance parameters like Power and Delay. We apply this technique on a few Digital Gates and compare the results with previous methods. We also introduce Bayesian analysis as a powerful method to update the PDF of performance parameters. Finally, we demonstrate how this statistical approach could supersede the approaches established on Frequentist analysis so as to achieve a more accurate estimation on Power and Delay for Digital Integrated Circuits.
Starting Page	1
Ending Page	5
File Size	280086
Page Count	5
File Format	PDF
ISBN	9781424443109
e-ISBN	9781424443116
DOI	10.1109/NORCHP.2009.5397842
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-16
Publisher Place	Norway
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Integrated circuit technology Measurement Bayesian estimation Statistical analysis circuit performance Delay estimation power and delay estimation Integrated circuit manufacture Bayesian methods Digital integrated circuits Probability density function Robustness Performance analysis
Content Type	Text
Resource Type	Article

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