NDLI: The effect of fingertip microstructures on tactile edge perception

Content Provider	IEEE Xplore Digital Library
Author	Gerling, G.J. Thomas, G.W.
Copyright Year	2005
Description	Author affiliation: Dept. of Mech. & Ind. Eng., Iowa Univ., Iowa City, IA, USA (Gerling, G.J.; Thomas, G.W.)
Abstract	People rely on tactile edge localization to ascertain the location and structure of edges. When pressure is applied to the skin, skin mechanoreceptors convert compressive stress/strain into neural signals. Many attempts to model this conversion neglect intermediate ridges, on the inside of the stiff epidermis. The receptors associated with detecting compressive and shear stresses reside at the tips of these ridges, suggesting a functional importance in the detection of stress. This work considers how underlying microstructure affects the mechanical propagation of stress to receptors. Two unique indenters are applied to two finite element models of idealized, fingerpad skin - one with ridge microstructure. Findings indicate that microstructure produces high, local stress concentrations at ridge tips near receptors. Because stress is focused at ridges beneath edges, there is a higher contrast of stress between ridge tips near the indenter's edge and those adjacent. This lensing effect mechanism appears to help distinguish edges.
Sponsorship	CNR - Nat. Res. Council Scuola Superiore di Studi Universitari e di Perfezionamento Sant'Anna Univ. of Pisa
Starting Page	63
Ending Page	72
File Size	1972215
Page Count	10
File Format	PDF
ISBN	0769523102
DOI	10.1109/WHC.2005.129
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-03-18
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Vibrations Compressive stress Image edge detection Surface morphology Industrial engineering Epidermis Skin Capacitive sensors Microstructure Finite element methods
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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