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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Joo-yong Lee PooGyeon Park |
| Copyright Year | 2013 |
| Description | Author affiliation: Dept. of Electr. Eng., POSTECH, Pohang, South Korea (Joo-yong Lee; PooGyeon Park) |
| Abstract | We introduce a method for detecting defects in TFT-LCD images with periodic patterns. We consider single-patterns with one pattern, and multi-patterns that is classified into a primary pattern region, a secondary pattern region and boundary region. After each region of the patterns is inspected by calculating a new image that removes periodic patterns and highlights defects, we can estimate the boundary region by least squares estimation. Finally we propose a local mean algorithm to inspect the boundary region. The each result of inspection is merged into the final binary image in which the defects are indicated. We focus on increasing speed of simulation to adopt practical system, and results of our methods are promising. We present inspection results on different types of images, the proposed method gives more accurate results than existing methods. |
| Sponsorship | IEEE Ind. Electron. Soc. |
| Starting Page | 584 |
| Ending Page | 588 |
| File Size | 1322693 |
| Page Count | 5 |
| File Format | |
| ISBN | 9788993215052 |
| ISSN | 20937121 |
| DOI | 10.1109/ICCAS.2013.6703935 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-10-20 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | image inspection TFT-LCD defect detection nonlocal mean similarity Thin film transistors |
| Content Type | Text |
| Resource Type | Article |
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