NDLI: Fully-coupled 3D electro-thermal field simulator for chip-level analysis of power devices

Content Provider	IEEE Xplore Digital Library
Author	Schoenmaker, W. Dupuis, O. De Smedt, B. Meuns, P. Ocenasek, J. Verhaegen, W. Dumlugol, D. Pfost, M.
Copyright Year	2013
Description	Author affiliation: Robert Bosch Center for Power Electron., Reutlmgen Univ., Reutlmgen, Germany (Pfost, M.) \|\| Magwel NV, Leuven, Belgium (Schoenmaker, W.; Dupuis, O.; De Smedt, B.; Meuns, P.; Ocenasek, J.; Verhaegen, W.; Dumlugol, D.)
Abstract	The paper presents a novel approach to modelling static and dynamic electro-thermal effects in large integrated and discrete semiconductor power devices. Electrical and thermal equations are solved simultaneously and selfconsistently from a single set of equations. A high spatial resolution allows accurate modelling of metal layers as required for advanced integrated BCD technologies. The simulator uses a well-adapted mesh for the substrate, which is important for the simulation of the temperature. Thus, both the voltage drop in the on-chip metallization as well as the device temperatures can accurately be determined without sacrificing accuracy or limiting the applicability of the simulator to special cases. Electrical and thermal conductivities of both metal and substrate are temperature dependent. Measurement and simulation results for test chips and real DMOS driver stages with small integrated temperature sensors are presented. An excellent match is observed even for very high temperatures exceeding 300°C. The tool integrates easily in an industrial design environment with direct import of GDS layout and ITF technology data.
Starting Page	210
Ending Page	215
File Size	1000326
Page Count	6
File Format	PDF
ISBN	9781479922710
e-ISBN	9781479922727
DOI	10.1109/THERMINIC.2013.6675199
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-25
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Content Type	Text
Resource Type	Article

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