NDLI: A testing method for the temperature difference of the helix SWS

Content Provider	IEEE Xplore Digital Library
Author	Pu Wei Guodong Wang Cheng Cheng Xiaohan Sun Bo Chen Jinjun Feng Tiechang Yan Yanmei Wang Dongya Lv
Copyright Year	2015
Description	Author affiliation: Beijing Vacuum Electron. Res. Inst., Beijing, China (Bo Chen; Jinjun Feng; Tiechang Yan; Yanmei Wang; Dongya Lv) \|\| Res. Center for Electron. Device & Syst. Reliability, Southeast Univ., Nanjing, China (Pu Wei; Guodong Wang; Cheng Cheng; Xiaohan Sun)
Abstract	We proposed a novel testing method for the temperature difference distribution between the helix and the shell of the helix slow-wave structure (SWS). The thermal resistance of the SWS can be deduced by the temperature difference. A distributed micro fiber Bragg grating (FBG) sensor array and the thermocouple sensors are designed to measure the temperature distribution of the helix and the shell respectively in SWS when heating the helix by the electricity. An experiment on an X-band SWS was made and the thermal resistance was deduced which makes the temperature distribution model of the SWS more accurate.
Starting Page	1
Ending Page	2
File Size	515767
Page Count	2
File Format	PDF
ISBN	9781479971091
e-ISBN	9781479971107
DOI	10.1109/IVEC.2015.7223998
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-04-27
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Sun thermal resistance slow-wave structure helix traveling-wave tubes temperature difference
Content Type	Text
Resource Type	Article

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