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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shikai Qi Xiaoxia Wang Jirun Luo Mingwei Hu Shike Zhao Yun Li Qi Zhang |
| Copyright Year | 2015 |
| Description | Author affiliation: Key Lab. of High Power Microwave Sources & Technol., Inst. of Electron., Beijing, China (Shikai Qi; Xiaoxia Wang; Jirun Luo; Mingwei Hu; Shike Zhao; Yun Li; Qi Zhang) |
| Abstract | Energy and local distribution of electron around the cathode have been simulated in a 30kW continuous wave magnetron tube which operates in normal output power. According to the simulation results, it is clearly that the cathode of magnetron is bombed by low energy electrons mostly among 0 and 2keV. Based on the fact that most of the back bombardment electron belong to low energy electron, when the energy of incident electron is among 0 and 2keV, the secondary electron emission yield (SEEY) of cathodes provided with different mass percent Re doping W-Re alloy are measured, eventually, we obtain the maximum SEEY of W-Re alloy cathode when adopted by 5%Re doping. |
| Starting Page | 1 |
| Ending Page | 2 |
| File Size | 442400 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781479971091 |
| e-ISBN | 9781479971107 |
| DOI | 10.1109/IVEC.2015.7223863 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-04-27 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cathodes Doping Metals Electron tubes Electron emission Power generation Surface treatment CST simulation resistive electron bombing alloy cathode secondary electron emission yield (SEEY) thermostability |
| Content Type | Text |
| Resource Type | Article |
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