NDLI: Electronic transport properties of a bismuth microwire array in a magnetic field

Content Provider	IEEE Xplore Digital Library
Author	Hasegawa, Y. Ishikawa, Y. Morita, H. Komine, T. Shirai, H. Nakamura, H.
Copyright Year	2005
Description	Author affiliation: Graduate Sch. of Sci. & Eng., Saitama Univ., Japan (Hasegawa, Y.; Ishikawa, Y.)
Abstract	The magneto-Seebeck coefficient and magneto-resistivity of a polycrystalline bismuth microwire array were measured under magnetic fields of 0 to 2 Tesla and at temperatures of 50 to 300 K. To avoid the influence of contact resistance between the wire array and the electrodes, bulk bismuth was used for the electrodes. In the absence of a magnetic field, the Seebeck coefficient and resistivity were -76 /spl mu/V/K and 1.8 /spl mu//spl Omega/m at 300 K, respectively. The magneto-Seebeck coefficient for the wire array increased with the application of an external magnetic field, attributable to the precise control of impurities and carrier scattering process in the fabrication of the wire array. The phonon drag effect was observed below 100 K, with a corresponding increase in the magneto-Seebeck coefficient under high magnetic fields. However, the magneto-resistivity was also raised under higher magnetic fields, detracting from the thermoelectric properties. Through analysis of the power factor, the optimum magnetic field was determined for each temperature, revealing a trend for the optimum magnetic field to increase with temperature. The power factor was improved by a maximum factor of 1.12, achieved at 200 K and 0.25 Tesla. Further improvements appear to be possible by eliminating the bulk bismuth employed for the electrodes.
Starting Page	388
Ending Page	391
File Size	742382
Page Count	4
File Format	PDF
ISBN	0780395522
ISSN	10942734
DOI	10.1109/ICT.2005.1519968
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic properties Bismuth Magnetic fields Magnetic field measurement Temperature Wire Electrodes Reactive power Electrical resistance measurement Contact resistance
Content Type	Text
Resource Type	Article

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