NDLI: I/sub DDQ/ current dependency on test vectors and bridging resistance

Content Provider	IEEE Xplore Digital Library
Author	Keshk, A. Miura, Y. Kinoshita, K.
Copyright Year	1999
Description	Author affiliation: Graduate Sch. of Eng., Osaka Univ., Japan (Keshk, A.)
Abstract	In this paper, we focus on how the I/sub DDQ/ current value varies depending on the test vectors and the resistance of bridging faults. Detection of a large I/sub DDQ/ is easier than a small I/sub DDQ/ because the value of I/sub DDQ/ is normally of the order of microamperes. If suitable logic values are assigned to the faulty nodes, a small channel resistance will be obtained and then a large I/sub DDQ/ will flow. We have performed the simulation to show that the value of I/sub DDQ/ depends on the test vectors that applied to the faulty nodes for external and internal bridging nodes. As a result, I/sub DDQ/ at the low resistance-bridging fault increased bp 26%-36% for external bridging faults between different gates. For the internal bridging fault between any gates, the increased I/sub DDQ/ is 27%-159% for all resistive bridging faults.
Starting Page	158
Ending Page	163
File Size	61474
Page Count	6
File Format	PDF
ISBN	0769503152
ISSN	10817735
DOI	10.1109/ATS.1999.810745
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-11-18
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Circuit testing Logic testing Current supplies Power supplies Circuit simulation Current measurement System testing Steady-state Power measurement
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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