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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hak-Soo Yu Shin, H. Chun, J.H. Abraham, J.A. |
| Copyright Year | 2004 |
| Description | Author affiliation: Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA (Hak-Soo Yu; Shin, H.; Chun, J.H.; Abraham, J.A.) |
| Abstract | Signatures used in low-cost schemes for testing analog and mixed-signal circuits do not directly represent or characterize the behavior of the device-under-test (DUT), since the lossy compression or complicated mathematical relations used can result in the loss of physical performance information. We develop a novel scheme where the signature is generated by built-in circuits based on a ternary signal representation (TSR), which represents the behavior of a signal with three levels, positive, zero, and negative. The signatures can be used directly to characterize DUTs or can be manipulated to obtain widely accepted dynamic performance parameters, such as SNR, THD, etc. Simulation results on a /spl Delta//spl Sigma/ DAC and a /spl Delta//spl Sigma/ ADC using TSR signatures through built-in circuits are presented to show the feasibility of the proposed method. |
| Sponsorship | IEEE Comput. Soc. Test Technol. Tech. Council IEEE Philadelphia Sect |
| Starting Page | 1389 |
| Ending Page | 1397 |
| File Size | 486524 |
| Page Count | 9 |
| File Format | |
| ISBN | 0780385802 |
| DOI | 10.1109/TEST.2004.1387414 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-10-26 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Signal representations Circuit testing Signal to noise ratio Automatic testing Built-in self-test Frequency Fault detection Harmonic distortion Jacobian matrices Analog computers |
| Content Type | Text |
| Resource Type | Article |
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