NDLI: Test session oriented built-in self-testable data path synthesis

Content Provider	IEEE Xplore Digital Library
Author	Han Bin Kim Takahashi, T. Dong Sam Ha
Copyright Year	1998
Description	Author affiliation: Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA (Han Bin Kim)
Abstract	Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design space, which may result in a local optimum. In this paper, we present a method which aims to address the problem. Our method tries to find an optimal register assignment for each k-test session. Therefore, it offers a range of designs to the designer with different figures of merit in area and test time. Experimental results show that our method performs better than or comparable to existing BIST synthesis systems.
Starting Page	154
Ending Page	163
File Size	1116050
Page Count	10
File Format	PDF
ISBN	0780350936
ISSN	10893539
DOI	10.1109/TEST.1998.743148
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-10-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic testing Built-in self-test Circuit testing Circuit synthesis Control system synthesis System testing Process design Logic design Hardware Circuit faults
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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Test session oriented built-in self-testable data path synthesis