NDLI: Testing embedded-core based system chips

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Testing embedded-core based system chips

Content Provider	IEEE Xplore Digital Library
Author	Zorian, Y. Marinissen, E.J. Dey, S.
Copyright Year	1998
Description	Author affiliation: Logic Vision, San Jose, CA, USA (Zorian, Y.)
Abstract	Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design in which every circuit is designed from scratch and reuse is limited to standard-cell libraries, is more and more replaced by a design style based on embedding large reusable modules, the so-called cores. This core-based design poses a series of new challenges, especially in the domains of manufacturing test and design validation and debug. This paper provides an overview of current industrial practices as well as academic research in these areas. We also discuss industry-wide efforts by VSIA and IEEE P1500 and describe the challenges for future research.
Starting Page	130
Ending Page	143
File Size	1581905
Page Count	14
File Format	PDF
ISBN	0780350936
ISSN	10893539
DOI	10.1109/TEST.1998.743146
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-10-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Manufacturing industries CMOS technology Circuit testing Libraries Buildings Intellectual property Manufacturing processes Assembly systems Floors
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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