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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Meier, K. Roellig, M. Schiessl, A. Wolter, K. |
| Copyright Year | 2011 |
| Description | Author affiliation: Fraunhofer IZFP-D, Dresden, Germany (Roellig, M.) || Continental Automotive GmbH, Regensburg, Germany (Schiessl, A.) || Technische Universität Dresden, Electronics Packaging Laboratory, D-01062, Germany (Meier, K.; Wolter, K.) |
| Abstract | In this work the life time of solder joints of SMD components is studied under vibration loading. This kind of purely mechanical load is one of the main failure causes in automotive electronics. A test vehicle has been designed to enable vibration testing on SMD capacitors (size 0805). The test vehicle is distinguished with a line clamping and stripe shape which both leads to a concerted loading of the component solder joints. The test vehicles were analysed for their resonant frequency prior test and loaded with a sinusoidal vibration close to the resonant frequency for certain numbers of cycles. The loading of the individual components was measured using a vibrometer. Components were stressed with wave amplitudes from 0.3 mm up to 0.8 mm and normalised cycle counts from 1 up to 12. All tests were accomplished at room temperature. Cross sectioning was performed to evaluate damage location within and cracking of the solder joints. The observed damage location clearly differs to results from temperature cycling tests. Cracking of the intermetallic interface was not observed. Cracks propagated in the solder bulk. This enables a solder fatigue model since no interface effect is involved in the damage process. |
| File Size | 2712203 |
| File Format | |
| ISBN | 9781457701078 |
| e-ISBN | 9781457701061 |
| DOI | 10.1109/ESIME.2011.5765838 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-04-18 |
| Publisher Place | Austria |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Frequency measurement Optical variables measurement Lead Position measurement Optical devices Vibration measurement Deformable models |
| Content Type | Text |
| Resource Type | Article |
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