NDLI: An active, non-intrusive, high resolution microwave field probe with applications in high power RF device and circuit design

Content Provider	IEEE Xplore Digital Library
Author	Cripps, S.C. Porch, A.
Copyright Year	2010
Description	Author affiliation: Cardiff University, U.K. (Porch, A.) \|\| Hywave Associates, Chard, Somerset, U.K. (Cripps, S.C.)
Abstract	This paper describes the design, fabrication, and applications of a novel high resolution electric field probe. In essence, the probe consists of a novel miniaturized open-circuited co-axial transmission line that can respond to local normal electric fields with a spatial resolution of about 100 microns. A key aspect of the probe is the use of an active amplifier close to the probe tip. This amplifier not only increases the sensitivity but provides isolation and termination of the unwanted stray pickup from the feeder cable. Results will be presented which show that the probe can resolve the voltage waveforms at individual bond wires in high power transistors. Larger devices have been observed to display substantial spatial variations in this test, which are strongly dependent on the external circuit feeding arrangements.
Starting Page	1
Ending Page	4
File Size	5300670
Page Count	4
File Format	PDF
ISBN	9781424466887
e-ISBN	9781424466894
DOI	10.1109/WAMICON.2010.5461857
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-04-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microwave devices Probes Radio frequency Circuit synthesis Spatial resolution Circuit testing Fabrication Power transmission lines Distributed parameter circuits Power cables power amplifiers Field probe voltage probe waveforms
Content Type	Text
Resource Type	Article

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