NDLI: Threshold-voltage instability of polymer thin-film transistor under gate-bias and drain-bias stresses

Content Provider	IEEE Xplore Digital Library
Author	Liu, Y.R. Yu, J.L. Lai, P.T. Wang, Z.X. Han, J. Liao, R.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong (Lai, P.T.) \|\| Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou (Liu, Y.R.; Yu, J.L.; Wang, Z.X.; Han, J.; Liao, R.)
Abstract	Polymer thin-film transistors (PTFTs) based on MEH-PPV semiconductor are fabricated by spin-coating process and characterized. Gate-bias and drain-bias stress effects at room temperature are observed in the devices. The saturation current decreases and the threshold voltage shifts toward negative direction upon the gate-bias stress. However, the saturation current increases and the threshold voltage shifts toward positive direction upon the drain-bias stress. For variable bias stress conditions, carrier mobility is almost unchanged. The results suggest that the origin of threshold-voltage shift upon negative gate-bias stress is predominantly associated with holes trapped within the $SiO_{2}$ gate dielectric or at the $SiO_{2}/Si$ interface due to hot-carrier emission under high gate-bias stress, while time-dependent charge trapping into the deep trap states in the channel region is responsible for the drain-bias stress effect in the PTFTs.
Starting Page	1
Ending Page	4
File Size	501336
Page Count	4
File Format	PDF
ISBN	9781424425396
DOI	10.1109/EDSSC.2008.4760739
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-12-08
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Polymer films Thin film transistors Stress Silicon Threshold voltage Dielectrics Substrates Stability Semiconductivity Temperature Polymer thin-film transistors Stress effect Threshold-voltage shift
Content Type	Text
Resource Type	Article

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