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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chatterjee, A. Roy, R.K. |
| Copyright Year | 1994 |
| Description | Author affiliation: Sch. of Electr. and Comput. Eng., Georgia Tech. Res. Inst., Atlanta, GA, USA (Chatterjee, A.) |
| Abstract | Fault diagnosis in digital signal processing (DSP) circuits is very important for debugging circuit prototypes and chips and for identifying manufacturing process related problems. In this paper, we address the problem of diagnosing failures in digital filters. It is assumed that the circuit response obtained during off-line testing of digital filters is to be used for fault diagnosis. The tests applied to the filter consist of input data patterns generated by a standard test pattern generation algorithm. We propose a design for diagnosability procedure, based on time space expansion of a digital filter, which allows one circuit node in addition to the normal filter output to be externally observable for diagnosability purposes. The diagnosis is performed by measuring the error magnitudes at the observable circuit nodes at different times during application of the test sequence. |
| Starting Page | 48 |
| Ending Page | 53 |
| File Size | 559486 |
| Page Count | 6 |
| File Format | |
| ISBN | 0818654406 |
| DOI | 10.1109/VTEST.1994.292335 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1994-04-25 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Digital filters Circuit testing Fault diagnosis Digital signal processing chips Test pattern generators Debugging Prototypes Manufacturing processes Signal processing algorithms Performance evaluation |
| Content Type | Text |
| Resource Type | Article |
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