NDLI: Component Linearity Test Improves Reliability Screening Through Measurement of Third Harmonic Index

Content Provider	IEEE Xplore Digital Library
Author	Salomon, Arne Troianello, Tony
Copyright Year	1973
Description	Author affiliation: Manager, Product Applications, Vishay Resistor Products, Malvern, Pennsylvania 19355 (Troianello, Tony) \|\| Reliability and Quality Control Manager, Radiometer, AS., Copenhagen, Denmark (Salomon, Arne)
Abstract	Environmental testing designed to cull out components which do not conform to typical performance parameters is a time consuming and often destructive method of reliability screening. It does not indicate the component's normal operational performacne and it cannot be used in incoming inspection or production monitoring. A nominally linear component, however, can be easily checked for its degree of non-linearity by selective measurement of the third harmonic voltage generated in the component when a pure sinusoidal current is applied. This measurement is capable of detecting abnormal conditions in resistors due to faulty welds, film aberrations, resis, tive path inconsistencies, contact instability, and other imperfections that may cause shifts in resistance value. It therefore can identify resistors that have a potential for excess parametric change even though they may never fail in actual operation. The third harmonic voltage is measured by exciting the component under test with a very pure sinusoidal current of 10 Khz frequency and measuring the 30 Khz voltage generated within the component. This requires a specially designed air coil transformer for impedance matching, and associated circuitry which guarantees 150 db suppression of the fundamental signal for minimum residual distortion and optimum instrument sensitivity. Various defects intentionally produced in Bulk Metal Film resistors have been subsequently screened by both the component linearity test and by standard repetitive short time overload tests. Units screened by both methods were subjected to environmental stresses.
Starting Page	69
Ending Page	76
File Size	8355320
Page Count	8
File Format	PDF
ISSN	07350791
DOI	10.1109/IRPS.1973.362569
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1973-04-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Linearity Electrical resistance measurement Current measurement Resistors Circuit testing Frequency measurement Inspection Production Voltage Fault detection
Content Type	Text
Resource Type	Article

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