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Content Provider | IEEE Xplore Digital Library |
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Author | Bastani, F.B. Ing-Ray Chen Tawei Tsao |
Copyright Year | 1994 |
Description | Author affiliation: Houston Univ., TX, USA (Bastani, F.B.) |
Abstract | In many situations, such as robot path planning and automated manufacturing systems, the output for a given input cannot be simply classified as being either correct (no failure) or incorrect (failure). Instead of an ad hoc binary classification of the correctness of the output, it is more intuitive to use a fuzzy set based classification scheme. One approach is to let the value of the fuzzy set membership function denote the degree of acceptability (i.e., correctness) of the output. In this paper, we investigate several such fuzzy-failure criteria and their effects on system reliability in embedded computer systems. We first model the fuzzy output level of a response to a sensor event as a random variable in the range of [0,1] with 0 indicating that the output is completely acceptable and 1 indicating that the output is completely unacceptable. Then we derive analytical expressions for the reliability of systems for various fuzzy-failure criteria and compare their numerical solutions. We conclude that the reliability of such systems depends significantly on the fuzzy-failure criterion defined by the system designer. |
Starting Page | 442 |
Ending Page | 448 |
File Size | 623720 |
Page Count | 7 |
File Format | |
ISBN | 0780317866 |
DOI | 10.1109/RAMS.1994.291149 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1994-01-24 |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Embedded computing Failure analysis Fuzzy sets Random variables Sensor systems Fuzzy systems Fuzzy logic Robotics and automation Path planning Manufacturing systems |
Content Type | Text |
Resource Type | Article |
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