NDLI: Principles of successful reliability growth applications

Content Provider	IEEE Xplore Digital Library
Author	Crow, L.H. Franklin, P.H. Robbins, N.B.
Copyright Year	1994
Description	Author affiliation: AT&T Bell Labs., Whippany, NJ, USA (Crow, L.H.)
Abstract	This paper discusses the successful application of integrated reliability growth testing (IRGT) to the development of a large switching system, and demonstrates the results obtained using a case study. In usual applications of reliability growth testing, it is customary to dedicate development test items for a period of time and implement design changes to improve the reliability of a fielded product. In IRGT, reliability growth is demonstrated through design changes which occur during development testing. This paper identifies the lessons learned from this application of IRGT principles. The success of the IRGT program provided the Switching System Pilot Project with several benefits, including: timely analysis of failed items; accurate problem classification; timely and accurate laboratory failure rates; early identification of pattern failures; metrics demonstrating; achieved reliability growth during development testing. While the Switching System Pilot Project IRGT effort was largely successful, a configuration management problem area was identified in terms of providing adequate configuration data for reliability analysis.
Starting Page	157
Ending Page	159
File Size	274379
Page Count	3
File Format	PDF
ISBN	0780317866
DOI	10.1109/RAMS.1994.291100
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-01-24
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Reliability engineering Switching systems Costs Engineering management System testing Design engineering Project management Maintenance engineering Materials reliability Quality management
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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