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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Checka, N. Wentzloff, D.D. Chandrakasan, A. Reif, R. |
| Copyright Year | 2005 |
| Description | Author affiliation: Microsystems Technol. Labs., MIT, Cambridge, MA, USA (Checka, N.; Wentzloff, D.D.; Chandrakasan, A.; Reif, R.) |
| Abstract | This study characterizes the effect of substrate noise on a standard component of the RF front end: the voltage controlled oscillator (VCO), as well as evaluating the effect of VCO bias current and guard rings on noise performance. Frequency effects of substrate noise are also examined through the study of VCOs at three different center frequencies: 900 MHz, 2.4 GHz, and 5.2 GHz. Substrate noise is a serious problem that continues to plague mixed-signal designs. Components of the RF frontend are particularly sensitive to substrate noise as the effectiveness of standard isolation techniques degrades at higher frequencies. This study has shown that the phase noise of a VCO is adversely affected by substrate noise. In the extreme, the VCO can lock to the substrate noise. Guard rings can effectively attenuate substrate noise at lower frequencies. For example, at 900 MHz, as much as 25 dB of isolation is observed. At 5.2 GHz, the isolation reduces to 10 dB. Furthermore, the use of guard rings can improve the response of the VCO to injection locking. |
| Sponsorship | IEEE Microwave Theory and Techniques Soc. IEEE Electron Devices Soc. IEEE Solid State Circuits Soc |
| Starting Page | 523 |
| Ending Page | 526 |
| File Size | 546059 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780389832 |
| ISSN | 15292517 |
| DOI | 10.1109/RFIC.2005.1489864 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-06-12 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Voltage-controlled oscillators Crosstalk Circuit noise Radio frequency Testing Noise generators Isolation technology Digital circuits Silicon Spectral analysis |
| Content Type | Text |
| Resource Type | Article |
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