NDLI: Study of interface behavior on dielectric properties of epoxy-silica nanocomposites

Content Provider	IEEE Xplore Digital Library
Author	Veena, M.G. Renukappa, N.M. Shivakumar, K.N. Seetharamu, S.
Copyright Year	2012
Description	Author affiliation: Department of Electronics and Communication, Sri Jayachamarajendra College of Engineering, Mysore-570 006, India (Veena, M.G.; Renukappa, N.M.) \|\| Materials Technology Division, Central Power Research Institute, Bengaluru-560080, India (Seetharamu, S.) \|\| Center for Composite Materials Research, Department of Mechanical Engineering, NC A&T State University, Greensboro, North Carolina- 27411, USA (Shivakumar, K.N.)
Abstract	This paper focused on epoxy-based nanodielectric composites with 5, 10, 15 and 20 wt.% of silica constituents prepared using simple mechanical mixing technique along with required curing cycles. The experimentally clarified dielectric constant (ϕ′) and dissipation factor (tanδ) are influenced by addition of nanosilica is discussed on the basis of the three core interface model proposed for interaction zones. The interfacial region (interaction zone) is likely to be pivotal in controlling properties, the bonding and crosslinking between epoxy-silica was characterized using Fourier transform Infrared Spectroscopy (FTIR) and Differential Scanning Calorimetery (DSC). In addition, Positron Annihilation Lifetime Spectroscopy (PALS) is used to determine free volume of nanocomposites.
Starting Page	1
Ending Page	4
File Size	682789
Page Count	4
File Format	PDF
ISBN	9781467328524
ISSN	21609241
e-ISBN	9781467328517
DOI	10.1109/ICPADM.2012.6318951
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-07-24
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectrics Materials Fabrication OWL Silicon compounds Positrons Degradation Glass transition temperature Dielectric constant tanδ Fourier Transform Infrared Spectroscopy Free volume
Content Type	Text
Resource Type	Article

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