NDLI: Tree propagation speeds in epoxy nanocomposites

Content Provider	IEEE Xplore Digital Library
Author	Tanaka, T.
Copyright Year	2012
Description	Author affiliation: IPS Research Center, Waseda University, 2-7 Hibikino, Wakamatsu-ku, Kitakyushu-shi 808-0135, JAPAN (Tanaka, T.)
Abstract	It was newly found that nano filler particles will decelerate tree growth or accelerate it according to the level of applied voltage. It is extremely interesting as for how they will act on tree propagation. There are three regions recognized for tree propagation speeds. That is, a tree grows starts but stops under a certain lower voltage (Region 1), it grows up to the opposite electrode above a certain higher voltage (Region 3), and it grows at a constant speed between the two voltages (Region 2). Nano filler particles will decelerate tree growth in Regions 1 and 2 and accelerate it in Region 3. “Cross over phenomenon” in tree length vs. applied voltage characteristics obtained in the past can be explained by the new basic finding. Two different mechanisms must work on tree growth. It is demonstrated that a PD erosion process is dominant in Region 1, while a rapid tree dielectric breakdown process is major in Region 3. Especially acceleration by nano particles is interesting to be explored in terms of interaction of tree propagation with the electrostatic force predictively emerged around nano filler particles. Experiments were carried out as follows. Tree propagation speeds were obtained in epoxy and its nanocomposite in successive three steps until a tree grows up to 10, 100, and 3000 µm, respectively. This measurement was enabled by detecting a certain PD magnitude leading to a power source shutdown. Detailed discussion is given in the paper particularly on mechanisms for above new findings.
Starting Page	1
Ending Page	6
File Size	944013
Page Count	6
File Format	PDF
ISBN	9781467328524
ISSN	21609241
e-ISBN	9781467328517
DOI	10.1109/ICPADM.2012.6318897
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-07-24
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electric breakdown Silicon compounds Testing Dielectrics Electrodes
Content Type	Text
Resource Type	Article

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