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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Leroux, C. Gautier, J. Chante, J.P. |
| Copyright Year | 1989 |
| Description | Author affiliation: D. LETI,CENG, 85X av. des Martyrs, 38041 Grenoble Cédex (Leroux, C.; Gautier, J.) || LPCA, INSA, 20 av. Albert Einstein, 69621 Villeurbanne Cédex (Chante, J.P.) |
| Abstract | Classical analytical models of CMOS latch-up assume that the latch-up phenomenon is the result of the interaction of two or more bipolar transistors. With such a model, sustaining of latch-up can be only explained by a sufficiently high value for the product of bipolar gains (classically ßn·ßp¿1 or ßn·ßp¿ f (Iddmax) [1]). Such an explanation fails with the reduction of gain at high injection current levels [2]. We can also ask, whether we can even speak of bipolar transistors when the base-collector junctions have disappeared. This effect can be observed in figure 1[3]. Our model of latch-up includes a novel, four terminal, bipolar transistor model. With it we can explain the sustaining of latch-up at high injection levels, voltage drops through the base can be accounted for, and the disappearance of the base-collector junction can be represented. Our model is compared with experimental results, and good correlation was seen between measured and simulated values of holding voltage. |
| Starting Page | 423 |
| Ending Page | 426 |
| File Size | 1026314 |
| Page Count | 4 |
| File Format | |
| ISBN | 0387510001 |
| DOI | 10.1007/978-3-642-52314-4_86 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1989-09-11 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Springer-Verlag Heidelberg |
| Subject Keyword | Analytical models Semiconductor process modeling Bipolar transistors Voltage Semiconductor device modeling CMOS technology Resistors Substrates Transmission line theory Equations |
| Content Type | Text |
| Resource Type | Article |
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