NDLI: A novel circuit topology for generating and validating digitally sense amplifier differentials for bulk and SOI

Content Provider	IEEE Xplore Digital Library
Author	Joshi, R.V. Yuen Chan
Copyright Year	2005
Description	Author affiliation: IBM, T. J. Watson Res. Center, Yorktown Heights, NY, USA (Joshi, R.V.; Yuen Chan)
Abstract	In this paper, a novel programmable voltage divider circuit is proposed for converting digital signals to differential (analog) signals which can be used to evaluate differential sense amplifies in the absence of SRAM cells for the first time. The differentials can be programmable and switchable to reverse polarity. A circuit utilizing this scheme is also proposed to test variety of differential circuits having small signal inputs. The digital input is used to generate analog signals to drive the differential circuits; results are then validated digitally to alleviate more complicated testing problems. The novel circuit technique is implemented in hardware and test results are corroborated with simulations. The circuit functions both in bulk and silicon on insulator (SOI) technologies.
Starting Page	371
Ending Page	374
File Size	513439
Page Count	4
File Format	PDF
ISBN	0780392051
DOI	10.1109/ESSCIR.2005.1541637
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-09-12
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit topology Differential amplifiers Circuit testing Silicon on insulator technology Voltage Clocks Decoding Latches Random access memory Hardware
Content Type	Text
Resource Type	Article

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