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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Choi, S.P. Oh, J.K. Han, A.K. Choi, Y.L. |
| Copyright Year | 2001 |
| Description | Author affiliation: Sch. of Electr. Eng., Seoul Nat. Univ., South Korea (Choi, S.P.) |
| Abstract | The device characteristics of a new SOI LIGBT, called the Dual Anode LIGBT, were investigated by 2-dimensional numerical simulation. It was shown that the negative differential resistance regime was completely eliminated without an additional process step and mask. The forward voltage drop of the DA-LIGBT at a current density of 100 A/cm/sup 2/, was 30% lower than that of the conventional SSA-LIGBT. This is attributed to the path of the electron carriers under the cathode region. The turn-off speed of the DA-LIGT is about one order faster than that of the LIGBT. The proposed DA-LIGBT may be an attractive device for power integrated circuits. |
| Sponsorship | IEEE |
| Starting Page | 153 |
| Ending Page | 156 |
| File Size | 338093 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780374320 |
| DOI | 10.1109/ISDRS.2001.984463 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2001-12-05 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | ISDRS-Univ of Maryland |
| Subject Keyword | Anodes Medical simulation Electrons Current density Solid modeling Breakdown voltage Immune system Cathodes Electric breakdown Nominations and elections |
| Content Type | Text |
| Resource Type | Article |
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