NDLI: On 2-dimensional consecutive systems once again

Content Provider	IEEE Xplore Digital Library
Author	Beiu, V. Daus, L.
Copyright Year	2015
Description	Author affiliation: Coll. of Sci., UAEU, Al Ain, United Arab Emirates (Daus, L.) \|\| Coll. of IT, UAEU, Al Ain, United Arab Emirates (Beiu, V.)
Abstract	Consecutive systems are attractive due to their potential for enhancing nano-architectures, as being able to significantly boost reliability. Additionally, communication at the nanoscale is also going to need methods allowing to achieve lower transmission bit error rates. In particular, nano-technologies like, e.g., molecular, nano-magnetic, nano-fluidic, and even FinFETs, should benefit from consecutive systems, a well-established redundancy scheme. This paper will start by briefly mentioning previous results for 1-dimensional linear consecutive-k-out-of-n:F systems with statistically independent components having the same failure probability q, before focusing on 2-dimensional consecutive systems and their variations. We shall go over a few bounds for estimating their reliability and shall present simulations for particular 2-dimensional cases. These will show that bounds are quite accurate, some of them even matching the reliability of the particular 2-dimensional consecutive systems considered. Conclusions are ending the paper.
Starting Page	464
Ending Page	467
File Size	264864
Page Count	4
File Format	PDF
e-ISBN	9781467381567
DOI	10.1109/NANO.2015.7388638
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-07-27
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Upper bound Redundancy Probability CMOS integrated circuits bounds Reliability consecutive systems
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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