NDLI: Characterization approaches of nanoscale modified plastics

Content Provider	IEEE Xplore Digital Library
Author	Vogel, D. Keller, J. Michel, B. Holst, M. Muzic, M.
Copyright Year	2004
Description	Author affiliation: Micro Mater. Center Berlin, Fraunhofer IZM, Berlin, Germany (Vogel, D.; Keller, J.; Michel, B.)
Abstract	Miniaturization in automotive electronics forces to reduce the size of filler particles in plastics, even to nano scale dimensions. R&D processes as well as later production quality control demand suitable tools and procedures to characterize nano filler particles in polymeric composites. The authors studied different SFM, FIB and SEM based methods of nano particle detection, imaging and quantification. Different scanning probe microscopy (SPM) modes have been compared to each other and to SEM/FIB imaging with regard to their suitability for nano filler characterization in plastics. The influence of surface finishing by focused ion beam (FIB) smoothing is analyzed with emphasis to subsequent quantitative characterization of filler content and distribution. SEM, FIB and SFM load state images have been utilized to measure deformation fields with nano and subnano resolution. The according nanoDAC method is intended to be used for studying fracture mechanisms in the very vicinity of crack tips in nanoscale modified plastics.
Starting Page	23
Ending Page	25
File Size	376793
Page Count	3
File Format	PDF
ISBN	0780385365
DOI	10.1109/NANO.2004.1392237
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-08-16
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Plastics Scanning electron microscopy Scanning probe microscopy Automotive electronics Research and development Particle production Quality control Polymers Surface finishing Focusing
Content Type	Text
Resource Type	Article

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