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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Baumann, G. Richter, H. Baumgartner, A. Ferling, D. Heilig, R. Hollmann, D. Muller, H. Nechansky, H. Schlechtweg, M. |
| Copyright Year | 1995 |
| Description | Author affiliation: Alcatel SEL AG, Pforzheim, Germany (Baumann, G.) |
| Abstract | In this paper the difference between flip chip and wire bond technology is demonstrated. Test assemblies with coplanar waveguides have been attached in flip chip and wire bond technology and measured up to 75 GHz. Further, the influence of a metallic lid on a coplanar waveguide structure is examined. To compare flip chip and wire bond interconnections, 51 GHz frontends with GaAs devices in coplanar waveguide technology have been realized. In one frontend the low noise amplifier (LNA) is connected to a planar patch antenna by wire bonding and in a second one by flip chip attachment. RF evaluations show the clear advantage of the flip chip version due to the lower insertion loss of the flip chip interconnections and the higher flexibility of mounting the MMICs directly on the back structure of the planar patch antenna, leading to reduced losses of the feedline. |
| Starting Page | 1639 |
| Ending Page | 1642 |
| File Size | 504123 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780325818 |
| ISSN | 0149645X |
| DOI | 10.1109/MWSYM.1995.406291 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1995-05-16 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Flip chip Wire Bonding Coplanar waveguides Patch antennas Testing Assembly Waveguide components Semiconductor device measurement Gallium arsenide |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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