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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Blache, F. Nebus, J.M. Bouysse, P. Villotte, J.P. |
| Copyright Year | 1995 |
| Description | Author affiliation: IRCOM, Limoges Univ., France (Blache, F.; Nebus, J.M.; Bouysse, P.; Villotte, J.P.) |
| Abstract | A fully automated multiharmonic load-pull system allowing accurate measurement and control of the first three harmonic load terminations of RF and microwave transistors is presented in this paper. The technical originality of the proposed system lies in that the first, second and third harmonic load terminations can be independently and automatically monitored and fixed while varying the input power driving the transistor at the fundamental frequency. Appropriate hardware and software allow fast and automatic plots of power/efficiency performances of DUTs versus input power for different harmonic loadings. To demonstrate an attractive application of the system, measurements of a 1800 /spl mu/m gate periphery MESFET at 1.8 GHz for mobile communication applications are presented. Both suitable harmonic load terminations and nonappropriate ones yielding respectively optimum and poor power added efficiency are given. |
| Starting Page | 1037 |
| Ending Page | 1040 |
| File Size | 335301 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780325818 |
| ISSN | 0149645X |
| DOI | 10.1109/MWSYM.1995.406149 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1995-05-16 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Power system harmonics Microwave transistors Application software Microwave measurements Automatic control Control systems Radio frequency Computerized monitoring Hardware Software performance |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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