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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shafarman, W.N. Huang, R.S. Stephens, S.H. |
| Copyright Year | 2006 |
| Description | Author affiliation: Inst. of Energy Conversion, Delaware Univ., Newark, DE (Shafarman, W.N.; Huang, R.S.; Stephens, S.H.) |
| Abstract | An aqueous Br-etch to smooth the surface of $Cu(InGa)Se_{2}$ thin films and reduce their thickness is used to enhance characterization of $Cu(InGa)Se_{2}$ solar cells. Two applications of this etch will be presented. First, the etch is used to obtain the smooth surface necessary for precise optical characterization by spectroscopic ellipsometry. Optical constants of etched Cu(InGa)Se2 match those of films peeled from the substrate, as has previously been used to provide the smooth surface for characterization. The optical properties of CdS grown on the etched $Cu(InGa)Se_{2}$ have been determined and are compared to those of single crystal CdS. Second, the etch is used to controllably reduce the Cu(InGa)Se2 thickness for characterizing the effect of absorber layer thickness. Devices have been fabricated using $Cu(InGa)Se_{2}$ layers with thicknesses from 0.4 to 1.8 mum with fill factor greater than 74% over the entire range. The main loss in efficiency with absorber layers less than 1mum is from lower short circuit current due partly to incomplete optical absorption. Solar cell losses with the thin specular absorber layers obtained by etching are compared to those with rougher deposited films |
| Sponsorship | IEEE Electron Devices Soc |
| Starting Page | 420 |
| Ending Page | 423 |
| File Size | 257692 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424400163 |
| DOI | 10.1109/WCPEC.2006.279479 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-05-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Photovoltaic cells Etching Optical films Optical losses Transistors Spectroscopy Ellipsometry Thickness control Short circuit currents Absorption |
| Content Type | Text |
| Resource Type | Article |
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