NDLI: Understanding Measurement Perturbation in Trace-based Data

Content Provider	IEEE Xplore Digital Library
Author	Mytkowicz, T. Diwan, A. Hauswirth, M. Sweeney, P.F.
Copyright Year	2007
Description	Author affiliation: Colorado Univ., Boulder, CO (Mytkowicz, T.; Diwan, A.)
Abstract	Performance analysts commonly use trace-based data containing hardware and software metrics to understand performance. The trace data is generated by instrumenting the code to increment a counter when an event occurs and to collect hardware and software metrics in a trace. Unfortunately, the act of collecting a trace can perturb the behavior that the trace is frying to capture. In this paper, we gain an understanding of perturbation due to measurement instrumentation of the system. We identify two mechanisms to quantify perturbation: inner and outer perturbation. Using inner perturbation, a performance analyst can determine when a run is perturbed by collecting too much information. Using outer perturbation, the performance analyst can determine if she can use the data from multiple runs as if the data were all from a single run. Our evaluation of these mechanisms lead to two results. First, we are surprised to find that even with minimal instrumentation overhead, which increased instructions executed by less than 3%, high perturbation resulted, which prevented one from correctly reasoning about metrics within a trace or across traces. Second, the instrumentation of different software metrics interact in subtle, and not always obvious, ways making the impact of instrumentation on perturbation difficult, if not impossible, to predict. Finally, we outline a methodology for collecting data while avoiding perturbation. When inner perturbation occurs, the performance analyst can spread out the data collection over multiple runs. When outer perturbation occurs, she can try different strategies for spreading out the data collection over multiple runs.
Starting Page	1
Ending Page	6
File Size	7188926
Page Count	6
File Format	PDF
ISBN	1424409098
DOI	10.1109/IPDPS.2007.370515
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-03-26
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Performance analysis Instruments Hardware Software metrics Counting circuits Gain measurement Information analysis Software performance Software tools Conferences
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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