NDLI: The influence of time sampling scheme on kinetic parameters obtained from compartmental modeling of a dynamic PET study

Content Provider	IEEE Xplore Digital Library
Author	Haggstrom, I. Larsson, A. Axelsson, J. Garpebring, A. Johansson, L. Schmidtlein, C.R. Sorensen, J. Karlsson, M.
Copyright Year	2012
Description	Author affiliation: Dept. of Med. Phys., Memorial Sloan-Kettering Cancer Center, New York, NY, USA (Schmidtlein, C.R.) \|\| Med. Sci., Uppsala Univ. Hosp., Uppsala, Sweden (Sorensen, J.) \|\| Dept. of Radiat. Sci., Umea Univ., Umea, Sweden (Haggstrom, I.; Larsson, A.; Axelsson, J.; Garpebring, A.; Johansson, L.; Karlsson, M.)
Abstract	Compartmental modeling of dynamic PET data enables quantification of tracer kinetics in vivo, through the obtained model parameters. The dynamic data is sorted into frames during or after the acquisition, with a sampling interval usually ranging from 10 s to 300 s. In this study we wanted to investigate the effect of the chosen sampling interval on kinetic parameters obtained from a 2-tissue model, in terms of bias and standard deviation, using a complete Monte Carlo simulated dynamic $^{18}F_FLT$ PET study. The results show that the bias and standard deviation in parameter Kl is small regardless of sampling scheme or noise in the time-activity curves (TACs), and that the bias and standard deviation in $k_{4}$ is large for all cases. The bias in Va is clearly dependent on sampling scheme, increasing for increased sampling interval. In general, a too short sampling interval results in very noisy images and a large bias of the parameter estimate, and a too long sampling interval also increases bias. Noise in the TACs is the largest source of bias.
Sponsorship	IEEE Nucl. Plasma Sci. Soc
Starting Page	3101
Ending Page	3107
File Size	1300163
Page Count	7
File Format	PDF
ISBN	9781467320283
ISSN	10823654
e-ISBN	9781467320306
DOI	10.1109/NSSMIC.2012.6551707
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-10-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	FLT PET dynamic PET Monte Carlo GATE compartment model time sampling sampling interval AIF
Content Type	Text
Resource Type	Article

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