NDLI: Polycrystalline BN and LiF Based Semiconductor Alpha Particle and Neutron Detectors

Content Provider	IEEE Xplore Digital Library
Author	Schieber, M. Roth, M. Zuck, A. Khakhan, O. Uher, J. Linhart, V. Pospisil, S. Fiederle, M.
Copyright Year	2006
Description	Author affiliation: Hebrew Univ. of Jerusalem (Schieber, M.; Roth, M.; Zuck, A.; Khakhan, O.)
Abstract	Composite, polycrystalline, semiconductor, hexagonal BN alone or mixed with $B_{4}C$ or $BMg_{2}$ and cubic LiF were embedded in an insulating matrix which acts as a binder and tested as alpha particle and neutron detectors. The boron containing semiconductors have the natural abundance of $^{10}B$ which is ~20%. In the case of LiF is the natural content of $^{6}Li$ only 7.4%. The matrix binder further reduces the contents of $^{10}B$ and $^{6}Li$ to about one half. For alpha particles from a $^{241}Am$ alpha source of $~10^{5}$ $cm^{-2}s^{-1},$ 5.5 MeV gives the detector a wide peak in the spectrum. In the case of the thermal neutron detection, if the sources are very weak of only ~100 $cm^{-2}sec^{-1},$ the neutron counting is possible by subtracting the total signal from the noise. The resulting a signal to noise (S/N) ratio is of only ~2 and one needs a larger collection time of hours for a larger number of pulses to be collected. With a source of a higher neutron flux such as a nuclear reactor, which can offer flux of $10^{7}$ $cm^{-2}s^{-1},$ is the S/N ratio of ~33. LiF composites with only 3.7% of $^{6}Li$ could also detect very weak neutron sources, but the very low amount of $^{6}Li$ produced a S/N ratio of ~1.4. Compared with widely used $^{3}He$ detectors is the thermal neutron detection efficiency of the BN and LiF based detectors significantly higher for the same sizes of detectors. Even at a pressure of 3 atmospheres of an inch in diameter $^{3}He$ detector is the detection efficiency 64% compared with ~72% of a 1 mm thick composite BN detector. Results of enriched $^{6}LiF$ and mixed BN composite detector measurements with stronger neutron sources will be also reported.
Starting Page	3728
Ending Page	3731
File Size	281146
Page Count	4
File Format	PDF
ISBN	1424405602
ISSN	10957863
DOI	10.1109/NSSMIC.2006.353804
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-29
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Alpha particles Neutrons Detectors Semiconductor device noise Helium Insulation Semiconductor device testing Boron Signal to noise ratio Atmosphere
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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