NDLI: Investigation of acquisition parameters for PVI normalization

Content Provider	IEEE Xplore Digital Library
Author	Kohlmyer, S.G. Kaplan, M.S. Lewellen, T.K.
Copyright Year	1998
Description	Author affiliation: Dept. of Radiol., Washington Univ., Seattle, WA, USA (Kohlmyer, S.G.)
Abstract	The authors studied the effects of count density, count rate, and source geometry on a model based normalization using a GE Advance PET system. To study precision vs. count density the authors generated crystal efficiencies, /spl epsi/, from 20 time equivalent PVI scans acquired with a 50 /spl mu/Ci rotating /sup 68/Ge line source, and calculated the standard deviation, /spl sigma/, of the individual /spl epsi/ over the 20 realizations. The /spl sigma/ followed the Poisson estimate of 1//spl radic/N where N is the total number of counts involving a given crystal. For example, an average value of 2.7 counts per line of response in the central 22 cm field of view resulted in 5,000 counts per crystal and a /spl sigma/ of 1.5%. Using a 20 cm cylinder filled with F-18, the authors studied count rate effects by measuring the difference between /spl epsi/ generated from acquisitions ranging in block deadtime (BDT) from 0.6% to 11.4% and those from a low rate, high count reference scan. Rate induced errors increased linearly from 0.5% to 4.8% over the 1.2% to 11.4% BDT range. The authors studied cylinder, annulus (20 cm OD and 14 cm ID), and rotating rod /sup 68/Ge source geometries. Eight sets of /spl epsi/ were generated for each geometry, and compared cylinder to annulus and cylinder to rotating rod using the Student's t statistic. Elliptical phantom data were normalized by each source geometry and reconstructed using 3DRP.
Starting Page	1328
Ending Page	1331
File Size	477309
Page Count	4
File Format	PDF
ISBN	0780342585
ISSN	10823654
DOI	10.1109/NSSMIC.1997.670566
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-11-09
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Geometry Interference Positron emission tomography Detectors Density measurement Radiology Solid modeling Computed tomography Statistics Imaging phantoms
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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