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Content Provider | IEEE Xplore Digital Library |
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Author | Sharma, Himanshu Dutt Pal, Tanmay |
Copyright Year | 2010 |
Description | Author affiliation: Central Electronics Engineering Research Institute(CEERI), (Council of Scientific and Industrial Research(CSIR)) Pilani-333031 (Raj.) India (Sharma, Himanshu Dutt) || Central Electronics Engineering Research Institute(CEERI), (Council of Scientific and Industrial Research(CSIR)) Pilani-333031(Raj.) India (Pal, Tanmay) |
Abstract | Authors present development of online tracking and control of nanomanipulator (MM3A®) tip to assist automation of micro/nano assembly procedure. The development presented here captures online images of the moving nanaomanipulator's tip, and then with a predefined application specific safety margin it generates a visual attention region on the screen for tip-tracking. Any micro/nano object, featuring as low as one pixel size, if comes within threshold region, it detects possibility of collision and a visual event is generated to take hold of the user attention. Its detection capability is limited only by vision system's resolution. Besides keeping track of safety margin, linear speed of the tip is also computed online. Online information of collision possibility and tip speed allows user to modify necessary controls to bring more safety in manipulation of costly and very delicate parts of the system. It also saves time and cost by avoiding unnecessary attention and collisions. It has been practically demonstrated in an experimental set up of Nanomanipulator (MM3A) working in sub-micron accuracy, equipped with a force measurement tip $(FMT^{R}),$ interacting with a micro-cantilever spring under a light microscope. |
Starting Page | 2288 |
Ending Page | 2292 |
File Size | 1187561 |
Page Count | 5 |
File Format | |
ISBN | 9781424452255 |
ISSN | 1553572X |
DOI | 10.1109/IECON.2010.5675103 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-11-07 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Pixel Nanobioscience Manipulators Collision avoidance Assembly Scanning electron microscopy |
Content Type | Text |
Resource Type | Article |
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